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X-RAY SPECTROSCOPY Edited by Shatendra K. Sharma X-Ray Spectroscopy Edited by Shatendra K. Sharma Published by InTech Janeza Trdine 9, 51000 Rijeka, Croatia Copyright © 2011 InTech All chapters are Open Access distributed under the Creative Commons Attribution 3.0 license, which allows users to download, copy and build upon published articles even for commercial purposes, as long as the author and publisher are properly credited, which ensures maximum dissemination and a wider impact of our publications. After this work has been published by InTech, authors have the right to republish it, in whole or part, in any publication of which they are the author, and to make other personal use of the work. Any republication, referencing or personal use of the work must explicitly identify the original source. As for readers, this license allows users to download, copy and build upon published chapters even for commercial purposes, as long as the author and publisher are properly credited, which ensures maximum dissemination and a wider impact of our publications. Notice Statements and opinions expressed in the chapters are these of the individual contributors and not necessarily those of the editors or publisher. No responsibility is accepted for the accuracy of information contained in the published chapters. The publisher assumes no responsibility for any damage or injury to persons or property arising out of the use of any materials, instructions, methods or ideas contained in the book. Publishing Process Manager Anja Filipovic Technical Editor Teodora Smiljanic Cover Designer InTech Design Team First published January, 2012 Printed in Croatia A free online edition of this book is available at www.intechopen.com Additional hard copies can be obtained from orders@intechweb.org X-Ray Spectroscopy, Edited by Shatendra K. Sharma p. cm. ISBN 978-953-307-967-7 free online editions of InTech Books and Journals can be found at www.intechopen.com Contents Preface IX Part 1 XRF Processes and Techniques 1 Chapter 1 X-Ray Spectroscopy Tools for the Characterization of Nanoparticles 3 Murid Hussain, Guido Saracco and Nunzio Russo Chapter 2 Chapter 3 A Practical Application of X-Ray Spectroscopy in Ti-Al-N and Cr-Al-N Thin Films 21 Leonid Ipaz, William Aperador, Julio Caicedo, Joan Esteve and Gustavo Zambrano High Resolution X-Ray Spectroscopy with Compound Semiconductor Detectors and Digital Pulse Processing Systems 39 Leonardo Abbene and Gaetano Gerardi Chapter 4 Chapter 5 Analysis of the K Satellite Lines in X-Ray Emission Spectra 65 M. Torres Deluigi and J. Díaz-Luque Application of Wavelength Dispersive X-Ray Spectroscopy in X-Ray Trace Element Analytical Techniques 81 Matjaž Kavčič Part 2 Chapter 6 Characterization and Analytical Applications of X-Rays 99 The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science 101 Frédéric Christien, Edouard Ferchaud, Pawel Nowakowski and Marion Allart ... - tailieumienphi.vn
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