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X-RAY SPECTROSCOPY
Edited by Shatendra K. Sharma
X-Ray Spectroscopy
Edited by Shatendra K. Sharma
Published by InTech
Janeza Trdine 9, 51000 Rijeka, Croatia
Copyright © 2011 InTech
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Publishing Process Manager Anja Filipovic Technical Editor Teodora Smiljanic
Cover Designer InTech Design Team
First published January, 2012 Printed in Croatia
A free online edition of this book is available at www.intechopen.com Additional hard copies can be obtained from orders@intechweb.org
X-Ray Spectroscopy, Edited by Shatendra K. Sharma p. cm.
ISBN 978-953-307-967-7
free online editions of InTech Books and Journals can be found at www.intechopen.com
Contents
Preface IX
Part 1 XRF Processes and Techniques 1
Chapter 1 X-Ray Spectroscopy Tools for
the Characterization of Nanoparticles 3 Murid Hussain, Guido Saracco and
Nunzio Russo
Chapter 2
Chapter 3
A Practical Application of X-Ray
Spectroscopy in Ti-Al-N and Cr-Al-N Thin Films 21 Leonid Ipaz, William Aperador, Julio Caicedo,
Joan Esteve and Gustavo Zambrano
High Resolution X-Ray Spectroscopy
with Compound Semiconductor
Detectors and Digital Pulse Processing Systems 39 Leonardo Abbene and Gaetano Gerardi
Chapter 4
Chapter 5
Analysis of the K Satellite
Lines in X-Ray Emission Spectra 65 M. Torres Deluigi and J. Díaz-Luque
Application of Wavelength Dispersive X-Ray Spectroscopy in
X-Ray Trace Element Analytical Techniques 81 Matjaž Kavčič
Part 2
Chapter 6
Characterization and Analytical Applications of X-Rays 99
The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science 101 Frédéric Christien, Edouard Ferchaud,
Pawel Nowakowski and Marion Allart
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